메뉴 건너뛰기




Volumn 44, Issue 6, 1997, Pages 957-964

A physics-based, dynamic thermal impedance model for SOI MOSFET's

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; EQUIVALENT CIRCUITS; HEAT RESISTANCE; SILICON ON INSULATOR TECHNOLOGY;

EID: 0031163798     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.585551     Document Type: Article
Times cited : (25)

References (24)
  • 1
    • 84939377322 scopus 로고    scopus 로고
    • "Effect of microscale thermal conduction on the packing limit of silicon-on-insulator electronic devices," vol. 15, pp. 715-722, Oct. 1992.
    • K. E. Goodson and M. I. Flik, "Effect of microscale thermal conduction on the packing limit of silicon-on-insulator electronic devices," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 15, pp. 715-722, Oct. 1992.
    • IEEE Trans. Comp., Hybrids, Manufact. Technol.
    • Goodson, K.E.1    Flik, M.I.2
  • 2
    • 84918815924 scopus 로고    scopus 로고
    • "The self-heating effect and its influence on the electrical properties of SOI MOSFET's," 1992, pp. 78-79.
    • Z. Chai and M. Berger, "The self-heating effect and its influence on the electrical properties of SOI MOSFET's," in Proc. IEEE Int. SOI Conf., 1992, pp. 78-79.
    • In Proc. IEEE Int. SOI Conf.
    • Chai, Z.1    Berger, M.2
  • 3
    • 0027855173 scopus 로고    scopus 로고
    • "Self-heating effects on SOI devices and implication to parameter extraction," 1993, pp. 148-149.
    • D. Yachou, J. Gautier, and C. Raynaud, "Self-heating effects on SOI devices and implication to parameter extraction," in Proc. IEEE Int. SOI Conf., 1993, pp. 148-149.
    • In Proc. IEEE Int. SOI Conf.
    • Yachou, D.1    Gautier, J.2    Raynaud, C.3
  • 4
    • 0027855174 scopus 로고    scopus 로고
    • "Effects of self-heating-induced negative output conductance in SOI circuits," 1993, pp. 152-153.
    • R. M. Fox and J. S. Brodsky, "Effects of self-heating-induced negative output conductance in SOI circuits," in Proc. IEEE Int. SOI Conf., 1993, pp. 152-153.
    • In Proc. IEEE Int. SOI Conf.
    • Fox, R.M.1    Brodsky, J.S.2
  • 6
    • 0027851214 scopus 로고    scopus 로고
    • "CMOS/DMOS power IC technology on thin-film SOI substrates," 1993, pp. 98-99.
    • G. M. Dolny, A. C. Ipri, and M. Batty, "CMOS/DMOS power IC technology on thin-film SOI substrates," in Proc. IEEE Int. SOI Conf., 1993, pp. 98-99.
    • In Proc. IEEE Int. SOI Conf.
    • Dolny, G.M.1    Ipri, A.C.2    Batty, M.3
  • 7
    • 33747691532 scopus 로고    scopus 로고
    • "Design of thin-film fully-depleted SOI CMOS analog circuits significantly outperforming bulk implementations," 1994, pp. 99-100.
    • D. Flandre, B. Gentinne, J. P. Eggermont, and P. Jespers, "Design of thin-film fully-depleted SOI CMOS analog circuits significantly outperforming bulk implementations," in Proc. IEEE Int. SOI Conf., 1994, pp. 99-100.
    • In Proc. IEEE Int. SOI Conf.
    • Flandre, D.1    Gentinne, B.2    Eggermont, J.P.3    Jespers, P.4
  • 8
    • 0026707171 scopus 로고    scopus 로고
    • "Monitoring the temperature rise in SOI transistors by measurement of leakage current," 1991, pp. 28-29.
    • L. J. McDaid, S. Hall, W. Eccleston, and J. C. Alderman, "Monitoring the temperature rise in SOI transistors by measurement of leakage current," in Proc. IEEE Int. SOI Conf., 1991, pp. 28-29.
    • In Proc. IEEE Int. SOI Conf.
    • McDaid, L.J.1    Hall, S.2    Eccleston, W.3    Alderman, J.C.4
  • 9
    • 85006867730 scopus 로고    scopus 로고
    • "Measurement and modeling of self-heating effects in SOI NMOSFET's," 1992, pp. 357-360.
    • L. T. Su et al., "Measurement and modeling of self-heating effects in SOI NMOSFET's," in IEDM Tech. Dig., 1992, pp. 357-360.
    • In IEDM Tech. Dig.
    • Su, L.T.1
  • 10
    • 0029545732 scopus 로고    scopus 로고
    • "Extraction of thermal resistance for fully-depleted SOI MOSFET's," 1995, pp. 78-79.
    • T. Y. Lee and R. M. Fox, "Extraction of thermal resistance for fully-depleted SOI MOSFET's," in Proc. IEEE Int. SOI Conf., 1995, pp. 78-79.
    • In Proc. IEEE Int. SOI Conf.
    • Lee, T.Y.1    Fox, R.M.2
  • 11
    • 0029271009 scopus 로고    scopus 로고
    • "Analysis and modeling of self-heating effects in thin-film SOI MOSFET's as a function of temperature," vol. 38, no. 3, pp. 615-618, 1995.
    • J. Jomaah, G. Ghibaudo, and F. Balestra, "Analysis and modeling of self-heating effects in thin-film SOI MOSFET's as a function of temperature," Solid-State Electron., vol. 38, no. 3, pp. 615-618, 1995.
    • Solid-State Electron.
    • Jomaah, J.1    Ghibaudo, G.2    Balestra, F.3
  • 12
    • 0027554870 scopus 로고    scopus 로고
    • "Linear dynamic self-heating in SOI MOSFET's," vol. 14, pp. 133-135, Mar. 1993.
    • A. L. Caviglia and A. A. Iliadis, "Linear dynamic self-heating in SOI MOSFET's," IEEE Electron Device Lett., vol. 14, pp. 133-135, Mar. 1993.
    • IEEE Electron Device Lett.
    • Caviglia, A.L.1    Iliadis, A.A.2
  • 13
    • 33747670680 scopus 로고    scopus 로고
    • "Modeling the I-V characteristics of fully-depleted SOI MOSFET's including self-heating," 1994, pp. 19-20.
    • N. D. Arora, L. T. Su, B. S. Doyle, and D. A. Antoniadis, "Modeling the I-V characteristics of fully-depleted SOI MOSFET's including self-heating," in Proc. IEEE Int. SOI Conf., 1994, pp. 19-20.
    • In Proc. IEEE Int. SOI Conf.
    • Arora, N.D.1    Su, L.T.2    Doyle, B.S.3    Antoniadis, D.A.4
  • 14
    • 0029530203 scopus 로고    scopus 로고
    • "A large-signal model for SOI MOSFET's including dynamic self-heating effects," 1995, pp. 16-17.
    • A. Caviglia and A. A. Iliadis, "A large-signal model for SOI MOSFET's including dynamic self-heating effects," in Proc. IEEE Int. SOI Conf., 1995, pp. 16-17.
    • In Proc. IEEE Int. SOI Conf.
    • Caviglia, A.1    Iliadis, A.A.2
  • 15
    • 0027814093 scopus 로고    scopus 로고
    • "Modeling of thin film SOI devices for circuit simulation including perinstance dynamic self-heating effects," 1993, pp. 150-151.
    • M. S. L. Lee, W. Redman-White, B. M. Tenbroek, and M. Robinson, "Modeling of thin film SOI devices for circuit simulation including perinstance dynamic self-heating effects," in Proc. IEEE Int. SOI Conf., 1993, pp. 150-151.
    • In Proc. IEEE Int. SOI Conf.
    • Lee, M.S.L.1    Redman-White, W.2    Tenbroek, B.M.3    Robinson, M.4
  • 16
    • 0026137501 scopus 로고    scopus 로고
    • "Estimation of heat transfer in SOI-MOSFET's," vol. 38, pp. 871-875, Apr. 1991.
    • M. Berger and Z. Chai, "Estimation of heat transfer in SOI-MOSFET's," IEEE Trans. Electron Devices, vol. 38, pp. 871-875, Apr. 1991.
    • IEEE Trans. Electron Devices
    • Berger, M.1    Chai, Z.2
  • 18
    • 0029406075 scopus 로고    scopus 로고
    • "Dynamic SPICE-simulation of the electrothermal behavior of SOI MOSFET's," vol. 42, pp. 1968-1974, Nov. 1995.
    • J. Bielefeld, G. Pelz, H. Bernd Abel, and G. Zimmer, "Dynamic SPICE-simulation of the electrothermal behavior of SOI MOSFET's," IEEE Trans. Electron Devices, vol. 42, pp. 1968-1974, Nov. 1995.
    • IEEE Trans. Electron Devices
    • Bielefeld, J.1    Pelz, G.2    Bernd Abel, H.3    Zimmer, G.4
  • 19
    • 33747659472 scopus 로고    scopus 로고
    • "SOI MOSFET modeling using an AC conductance technique to determine heating," 1994, pp. 21-22.
    • R. Tu et al., "SOI MOSFET modeling using an AC conductance technique to determine heating," in Proc. IEEE Int. SOI Conf., 1994, pp. 21-22.
    • In Proc. IEEE Int. SOI Conf.
    • Tu, R.1
  • 20
    • 0029291056 scopus 로고    scopus 로고
    • "Measurement of I-V curves of silicon-on-insulator (SOI) MOSFET's without self-heating," vol. 16, pp. 145-147, Apr. 1995.
    • K. A. Jenkins and J. Y.-C. Sun, "Measurement of I-V curves of silicon-on-insulator (SOI) MOSFET's without self-heating," IEEE Electron Device Lett., vol. 16, pp. 145-147, Apr. 1995.
    • IEEE Electron Device Lett.
    • Jenkins, K.A.1    Sun, J.Y.-C.2
  • 24


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.