Analysis and modeling of self-heating effects in thin-film SOI MOSFETs as a function of temperature

Solid State Electronics

Volumn 38, Issue 3, 1995, Pages 615-618

  Jomaah, J ^a   Ghibaudo, G ^a   Balestra, F ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; HEATING; MATHEMATICAL MODELS; SILICON ON INSULATOR TECHNOLOGY; SUBSTRATES; THERMAL EFFECTS; THIN FILM TRANSISTORS;

DRAIN CURRENT; DRAIN VOLTAGE; SELF HEATING EFFECTS;

MOSFET DEVICES;

EID: 0029271009     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(94)00130-8     Document Type: Article

References (7)

1. Analytical Device Model of SOI MOSFETs Including Self-Heating Effect