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Volumn , Issue , 1993, Pages 148-149
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Self-heating effects on SOI devices and implication to parameter extraction
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Author keywords
[No Author keywords available]
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Indexed keywords
HEAT LOSSES;
HEATING;
IONIZATION;
MATHEMATICAL MODELS;
MOSFET DEVICES;
TEMPERATURE;
THERMAL CONDUCTIVITY;
THERMAL EFFECTS;
THIN FILMS;
GATE VOLTAGE;
IMPACT IONIZATION EFFECT;
IMPACT IONIZATION GENERATION RATE;
KINK EFFECT;
NEGATIVE DIFFERENTIAL RESISTANCE;
PARAMETER EXTRACTION;
SELF HEATING;
SOI DEVICES HEAT DISSIPATION;
SILICON ON INSULATOR TECHNOLOGY;
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EID: 0027855173
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (6)
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References (6)
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