Effects of self-heating-induced negative output conductance in SOI circuits

IEEE International SOI Conference

Volumn , Issue , 1993, Pages 152-153

  Fox, R M ^a   Brodsky, J S ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; ELECTRIC INVERTERS; ELECTRIC NETWORK ANALYSIS; HEAT RESISTANCE; HEATING; LOGIC CIRCUITS; MATHEMATICAL MODELS; MOSFET DEVICES; NETWORKS (CIRCUITS); THERMAL EFFECTS;

CMOS INVERTER; FIRST ORDER ANALYSIS; HEAT FLOW ANALYSIS; HYSTERESIS LOOP; SELF HEATING EFFECT; SOI MOSFET; SPICE MODEL;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0027855174     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)