NEW STRAIGHTFORWARD CALIBRATION AND CORRECTION PROCEDURE FOR 'ON WAFER' HIGH FREQUENCY S-PARAMETER MEASUREMENTS (45 MHZ-18 GHZ).

Volumn , Issue , 1987, Pages 70-73

  van Wijnen, P J ^a   Claessen, H R ^a   Wolsheimer, E A ^a  

^a Philips Signetics Company   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE MEASUREMENTS; TRANSISTORS - MICROWAVES;

CALIBRATION/CORRECTION PROCEDURE; ON-WAFER MICROWAVE MEASUREMENTS;

TRANSISTORS, BIPOLAR;

EID: 0023576614     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)