X-Ray Reflectivity Study of the Structural Properties of SiO2 and Siof Thin Films

Journal of the Electrochemical Society

Volumn 148, Issue 12, 2001, Pages

  Ceriola, Giulio ^a   Iacona, Fabio ^a   La Via, Francesco ^a   Raineri, Vito ^a   Bontempi, Elza ^b   Depero, Laura E ^b  

^a CNR IMETEM   (Italy)

^b UNIVERSITY OF BRESCIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012407741     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1417557     Document Type: Article

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