-
5
-
-
0029344912
-
-
R. J. Severens, G. J. H. Brussaard, M. C. M. van de Sanden, and D. C. Schram, Appl. Phys. Lett. 67, 491 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 491
-
-
Severens, R.J.1
Brussaard, G.J.H.2
Van De Sanden, M.C.M.3
Schram, D.C.4
-
6
-
-
0030133959
-
-
M. C. M. van de Sanden, R. J. Severens, J. W. A. M. Gielen, R. M. J. Paffen, and D. C. Schram, Plasma Sources Sci. Technol. 5, 268 (1996).
-
(1996)
Plasma Sources Sci. Technol.
, vol.5
, pp. 268
-
-
Van De Sanden, M.C.M.1
Severens, R.J.2
Gielen, J.W.A.M.3
Paffen, R.M.J.4
Schram, D.C.5
-
7
-
-
0029517653
-
-
R. J. Severens, G. J. H. Brussaard, H. J. M. Verhoeven, M. C. M. van de Sanden, and D. C. Schram, Mater. Res. Soc. Symp. Proc. 377, 33 (1995).
-
(1995)
Mater. Res. Soc. Symp. Proc.
, vol.377
, pp. 33
-
-
Severens, R.J.1
Brussaard, G.J.H.2
Verhoeven, H.J.M.3
Van De Sanden, M.C.M.4
Schram, D.C.5
-
8
-
-
0030383224
-
-
R. J. Severens, M. C. M. van de Sanden, H. J. M. Verhoeven, J. Bastiaanssen, and D. C. Schram, Mater. Res. Soc. Symp. Proc. 420, 341 (1996).
-
(1996)
Mater. Res. Soc. Symp. Proc.
, vol.420
, pp. 341
-
-
Severens, R.J.1
Van De Sanden, M.C.M.2
Verhoeven, H.J.M.3
Bastiaanssen, J.4
Schram, D.C.5
-
9
-
-
84940885780
-
-
edited by J. L. Vossen and W. Kern Academic, Boston
-
G. Lucovsky, D. Tsu, R. Rudder, and R. Markunas, in Thin Film Processes II, edited by J. L. Vossen and W. Kern (Academic, Boston, 1991), pp. 565-620; G. N. Parsons, D. V. Tsu, and G. Lucovsky, J. Non-Cryst. Solids 97/98, 1375 (1987).
-
(1991)
Thin Film Processes II
, pp. 565-620
-
-
Lucovsky, G.1
Tsu, D.2
Rudder, R.3
Markunas, R.4
-
10
-
-
1342285238
-
-
G. Lucovsky, D. Tsu, R. Rudder, and R. Markunas, in Thin Film Processes II, edited by J. L. Vossen and W. Kern (Academic, Boston, 1991), pp. 565-620; G. N. Parsons, D. V. Tsu, and G. Lucovsky, J. Non-Cryst. Solids 97/98, 1375 (1987).
-
(1987)
J. Non-Cryst. Solids
, vol.97-98
, pp. 1375
-
-
Parsons, G.N.1
Tsu, D.V.2
Lucovsky, G.3
-
11
-
-
0025502965
-
-
B. Anthony, T. Hsu, L. Breaux, R. Qian, S. Banerjee, and A. Tasch, J. Electron. Mater. 19, 1089 (1990).
-
(1990)
J. Electron. Mater.
, vol.19
, pp. 1089
-
-
Anthony, B.1
Hsu, T.2
Breaux, L.3
Qian, R.4
Banerjee, S.5
Tasch, A.6
-
14
-
-
0000871865
-
-
J. M. Jasinski, J. Vac. Sci. Technol. A 13, 1935 (1995); J. M. Jasinski, J. Phys. Chem. 97, 7385 (1993).
-
(1993)
J. Phys. Chem.
, vol.97
, pp. 7385
-
-
Jasinski, J.M.1
-
15
-
-
0026415554
-
-
N. M. Johnson, P. V. Santos, C. E. Nebel, W. B. Jackson, R. A. Street, K. S. Stevens, and J. Walker, J. Non-Cryst. Solids 137/138, 235 (1991); N. M. Johnson, C. E. Nebel, P. V. Santos, W. B. Jackson, R. A. Street, K. S. Stevens, and J. Walker, Appl. Phys. Lett. 59, 1443 (1991).
-
(1991)
J. Non-Cryst. Solids
, vol.137-138
, pp. 235
-
-
Johnson, N.M.1
Santos, P.V.2
Nebel, C.E.3
Jackson, W.B.4
Street, R.A.5
Stevens, K.S.6
Walker, J.7
-
16
-
-
0001311905
-
-
N. M. Johnson, P. V. Santos, C. E. Nebel, W. B. Jackson, R. A. Street, K. S. Stevens, and J. Walker, J. Non-Cryst. Solids 137/138, 235 (1991); N. M. Johnson, C. E. Nebel, P. V. Santos, W. B. Jackson, R. A. Street, K. S. Stevens, and J. Walker, Appl. Phys. Lett. 59, 1443 (1991).
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 1443
-
-
Johnson, N.M.1
Nebel, C.E.2
Santos, P.V.3
Jackson, W.B.4
Street, R.A.5
Stevens, K.S.6
Walker, J.7
-
17
-
-
84941489643
-
-
D. V. Tsu, G. N. Parsons, G. Lucovsky, and M. W. Watkins, J. Vac. Sci. Technol. A 7, 1115 (1989); G. N. Parsons, D. V. Tsu, C. Wang, and G. Lucovsky, ibid. 7, 1124 (1989).
-
(1989)
J. Vac. Sci. Technol. A
, vol.7
, pp. 1115
-
-
Tsu, D.V.1
Parsons, G.N.2
Lucovsky, G.3
Watkins, M.W.4
-
18
-
-
84957284082
-
-
D. V. Tsu, G. N. Parsons, G. Lucovsky, and M. W. Watkins, J. Vac. Sci. Technol. A 7, 1115 (1989); G. N. Parsons, D. V. Tsu, C. Wang, and G. Lucovsky, ibid. 7, 1124 (1989).
-
(1989)
J. Vac. Sci. Technol. A
, vol.7
, pp. 1124
-
-
Parsons, G.N.1
Tsu, D.V.2
Wang, C.3
Lucovsky, G.4
-
20
-
-
11644328408
-
-
edited by G. W. Rubloff AIP, New York
-
G. Lucovsky, D. V. Tsu, and G. N. Parsons, in Deposition and Growth: Limits for Microelectronics, edited by G. W. Rubloff (AIP, New York, 1988), p. 172.
-
(1988)
Deposition and Growth: Limits for Microelectronics
, pp. 172
-
-
Lucovsky, G.1
Tsu, D.V.2
Parsons, G.N.3
-
21
-
-
0042188744
-
-
G. J. Meeusen, R. P. Dahiya, M. C. M. van de Sanden, G. Dinescu, Z. Qing, R. F. G. Meulenbroeks, and D. C. Schram, Plasma Sources Sci. Technol. 3, 521 (1994).
-
(1994)
Plasma Sources Sci. Technol.
, vol.3
, pp. 521
-
-
Meeusen, G.J.1
Dahiya, R.P.2
Van De Sanden, M.C.M.3
Dinescu, G.4
Qing, Z.5
Meulenbroeks, R.F.G.6
Schram, D.C.7
-
22
-
-
0031378799
-
-
M. C. M. van de Sanden, R. J. Severens, W. M. M. Kessels, F. van de Pas, L. van Ijzendoorn, and D. C. Schram, Mater. Res. Soc. Symp. Proc. 467, 621 (1997).
-
(1997)
Mater. Res. Soc. Symp. Proc.
, vol.467
, pp. 621
-
-
Van De Sanden, M.C.M.1
Severens, R.J.2
Kessels, W.M.M.3
Van De Pas, F.4
Van Ijzendoorn, L.5
Schram, D.C.6
-
24
-
-
0000781578
-
-
M. C. M. van de Sanden, G. M. Janssen, J. M. de Regt, D. C. Schram, J. A. M. van der Mullen, and B. van der Sijde, Rev. Sci. Instrum. 63, 3369 (1992).
-
(1992)
Rev. Sci. Instrum.
, vol.63
, pp. 3369
-
-
Van De Sanden, M.C.M.1
Janssen, G.M.2
De Regt, J.M.3
Schram, D.C.4
Van Der Mullen, J.A.M.5
Van Der Sijde, B.6
-
25
-
-
0001648535
-
-
M. J. de Graaf, R. J. Severens, R. P. Dahiya, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 48, 2098 (1993).
-
(1993)
Phys. Rev. E
, vol.48
, pp. 2098
-
-
De Graaf, M.J.1
Severens, R.J.2
Dahiya, R.P.3
Van De Sanden, M.C.M.4
Schram, D.C.5
-
26
-
-
0043081584
-
-
R. F. G. Meulenbroeks, M. F. M. Steenbakkers, Z. Qing, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 49, 2272 (1994).
-
(1994)
Phys. Rev. E
, vol.49
, pp. 2272
-
-
Meulenbroeks, R.F.G.1
Steenbakkers, M.F.M.2
Qing, Z.3
Van De Sanden, M.C.M.4
Schram, D.C.5
-
27
-
-
0003834831
-
-
G. J. H. Brussaard, M. van der Steen, M. Carrère, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 54, 1906 (1996).
-
(1996)
Phys. Rev. E
, vol.54
, pp. 1906
-
-
Brussaard, G.J.H.1
Van Der Steen, M.2
Carrère, M.3
Van De Sanden, M.C.M.4
Schram, D.C.5
-
28
-
-
35949008124
-
-
R. F. G. Meulenbroeks, A. J. van Beek, A. J. G. van Helvoort, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 49, 4397 (1994); R. F. G. Meulenbroeks, R. A. H. Engeln, C. Box, I. de Bari, M. C. M. van de Sanden, J. J. A. M. van der Mullen, and D. C. Schram, Phys. Plasmas 2, 1002 (1995); R. F. G. Meulenbroeks, R. A. H. Engeln, M. N. A. Beurskens, R. M. J. Paffen, M. C. M. van de Sanden, J. J. A. M. van der Mullen, and D. C. Schram, Plasma Sources Sci. Technol. 4, 74 (1995).
-
(1994)
Phys. Rev. E
, vol.49
, pp. 4397
-
-
Meulenbroeks, R.F.G.1
Van Beek, A.J.2
Van Helvoort, A.J.G.3
Van De Sanden, M.C.M.4
Schram, D.C.5
-
29
-
-
0006754224
-
-
R. F. G. Meulenbroeks, A. J. van Beek, A. J. G. van Helvoort, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 49, 4397 (1994); R. F. G. Meulenbroeks, R. A. H. Engeln, C. Box, I. de Bari, M. C. M. van de Sanden, J. J. A. M. van der Mullen, and D. C. Schram, Phys. Plasmas 2, 1002 (1995); R. F. G. Meulenbroeks, R. A. H. Engeln, M. N. A. Beurskens, R. M. J. Paffen, M. C. M. van de Sanden, J. J. A. M. van der Mullen, and D. C. Schram, Plasma Sources Sci. Technol. 4, 74 (1995).
-
(1995)
Phys. Plasmas
, vol.2
, pp. 1002
-
-
Meulenbroeks, R.F.G.1
Engeln, R.A.H.2
Box, C.3
De Bari, I.4
Van De Sanden, M.C.M.5
Van Der Mullen, J.J.A.M.6
Schram, D.C.7
-
30
-
-
0029252871
-
-
R. F. G. Meulenbroeks, A. J. van Beek, A. J. G. van Helvoort, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 49, 4397 (1994); R. F. G. Meulenbroeks, R. A. H. Engeln, C. Box, I. de Bari, M. C. M. van de Sanden, J. J. A. M. van der Mullen, and D. C. Schram, Phys. Plasmas 2, 1002 (1995); R. F. G. Meulenbroeks, R. A. H. Engeln, M. N. A. Beurskens, R. M. J. Paffen, M. C. M. van de Sanden, J. J. A. M. van der Mullen, and D. C. Schram, Plasma Sources Sci. Technol. 4, 74 (1995).
-
(1995)
Plasma Sources Sci. Technol.
, vol.4
, pp. 74
-
-
Meulenbroeks, R.F.G.1
Engeln, R.A.H.2
Beurskens, M.N.A.3
Paffen, R.M.J.4
Van De Sanden, M.C.M.5
Van Der Mullen, J.J.A.M.6
Schram, D.C.7
-
31
-
-
0000569936
-
-
M. C. M. van de Sanden, J. M. de Regt, and D. C. Schram, Plasma Sources Sci. Technol. 3, 501 (1994); M. C. M. van de Sanden, R. van den Bercken, and D. C. Schram, ibid. 3, 511 (1994).
-
(1994)
Plasma Sources Sci. Technol.
, vol.3
, pp. 501
-
-
Van De Sanden, M.C.M.1
De Regt, J.M.2
Schram, D.C.3
-
32
-
-
36149036493
-
-
M. C. M. van de Sanden, J. M. de Regt, and D. C. Schram, Plasma Sources Sci. Technol. 3, 501 (1994); M. C. M. van de Sanden, R. van den Bercken, and D. C. Schram, ibid. 3, 511 (1994).
-
(1994)
Plasma Sources Sci. Technol.
, vol.3
, pp. 511
-
-
Van De Sanden, M.C.M.1
Van Den Bercken, R.2
Schram, D.C.3
-
33
-
-
0000210872
-
-
R. F. G. Meulenbroeks, D. C. Schram, M. C. M. van de Sanden, and J. A. M. van der Mullen, Phys. Rev. Lett. 76, 1840 (1996).
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 1840
-
-
Meulenbroeks, R.F.G.1
Schram, D.C.2
Van De Sanden, M.C.M.3
Van Der Mullen, J.A.M.4
-
35
-
-
0039650315
-
-
Doorwerth, The Netherlands
-
M. G. H. Boogaarts, G. J. Brinkman, H. W. P. van der Heijden, P. Vankan, S. Mazouffre, J. A. M. van der Mullen, D. C. Schram, and H. F. Döbele, Proceedings of the 8th International Symposium on Laser-Aided Plasma Diagnostics, Doorwerth, The Netherlands, 1997, p. 109.
-
(1997)
Proceedings of the 8th International Symposium on Laser-Aided Plasma Diagnostics
, pp. 109
-
-
Boogaarts, M.G.H.1
Brinkman, G.J.2
Van Der Heijden, H.W.P.3
Vankan, P.4
Mazouffre, S.5
Van Der Mullen, J.A.M.6
Schram, D.C.7
Döbele, H.F.8
-
37
-
-
85034306993
-
-
J. Perrin, in Ref. 4, pp. 177-237
-
J. Perrin, in Ref. 4, pp. 177-237.
-
-
-
-
39
-
-
0025482294
-
-
R. Winkler, M. Capitelli, C. Gorse, and J. Wilhelm, Plasma Chem. Plasma Process. 10, 419 (1990).
-
(1990)
Plasma Chem. Plasma Process.
, vol.10
, pp. 419
-
-
Winkler, R.1
Capitelli, M.2
Gorse, C.3
Wilhelm, J.4
-
40
-
-
0001091443
-
-
R. Viswanathan, D. L. Thompson, and L. M. Raff, J. Chem. Phys. 80, 4230 (1984); K. F. Roenigk, K. F. Jensen, and R. W. Carr, J. Phys. Chem. 91, 5732 (1987).
-
(1984)
J. Chem. Phys.
, vol.80
, pp. 4230
-
-
Viswanathan, R.1
Thompson, D.L.2
Raff, L.M.3
-
41
-
-
0001165697
-
-
R. Viswanathan, D. L. Thompson, and L. M. Raff, J. Chem. Phys. 80, 4230 (1984); K. F. Roenigk, K. F. Jensen, and R. W. Carr, J. Phys. Chem. 91, 5732 (1987).
-
(1987)
J. Phys. Chem.
, vol.91
, pp. 5732
-
-
Roenigk, K.F.1
Jensen, K.F.2
Carr, R.W.3
-
42
-
-
0001883643
-
-
J. Perrin, O. Leroy, and M. C. Bordage, Contrib. Plasma Phys. 36, 3 (1996), J. Perrin, J. Phys. D 26, 1662 (1993).
-
(1996)
Contrib. Plasma Phys.
, vol.36
, pp. 3
-
-
Perrin, J.1
Leroy, O.2
Bordage, M.C.3
-
43
-
-
0027678223
-
-
J. Perrin, O. Leroy, and M. C. Bordage, Contrib. Plasma Phys. 36, 3 (1996), J. Perrin, J. Phys. D 26, 1662 (1993).
-
(1993)
J. Phys. D
, vol.26
, pp. 1662
-
-
Perrin, J.1
-
44
-
-
0000923191
-
-
M. Capitelli, G. Colonna, A. Giquel, C. Gorse, K. Hassouni, and S. Longo, Phys. Rev. E 54, 1843 (1996).
-
(1996)
Phys. Rev. E
, vol.54
, pp. 1843
-
-
Capitelli, M.1
Colonna, G.2
Giquel, A.3
Gorse, C.4
Hassouni, K.5
Longo, S.6
-
45
-
-
0000422751
-
-
A. J. M. Buuron, D. K. Otorbaev, M. C. M. van de Sanden, and D. C. Schram, Phys. Rev. E 50, 1383 (1994).
-
(1994)
Phys. Rev. E
, vol.50
, pp. 1383
-
-
Buuron, A.J.M.1
Otorbaev, D.K.2
Van De Sanden, M.C.M.3
Schram, D.C.4
-
47
-
-
0025486122
-
-
J. L. Jeauberteau, D. Conte, M. I. Baratron, P. Quintard, J. Aubreton, and A. Catherinot, Plasma Chem. Plasma Process. 10, 401 (1990).
-
(1990)
Plasma Chem. Plasma Process.
, vol.10
, pp. 401
-
-
Jeauberteau, J.L.1
Conte, D.2
Baratron, M.I.3
Quintard, P.4
Aubreton, J.5
Catherinot, A.6
-
48
-
-
0000296187
-
-
P. Haaland, J. Chem. Phys. 93, 4066 (1990); S. K. Srivastava, E. Krishnakumar, and A. C. de Souza, Int. J. Mass Spectrom. Ion Processes 107, 83 (1991).
-
(1990)
J. Chem. Phys.
, vol.93
, pp. 4066
-
-
Haaland, P.1
-
49
-
-
0041589166
-
-
P. Haaland, J. Chem. Phys. 93, 4066 (1990); S. K. Srivastava, E. Krishnakumar, and A. C. de Souza, Int. J. Mass Spectrom. Ion Processes 107, 83 (1991).
-
(1991)
Int. J. Mass Spectrom. Ion Processes
, vol.107
, pp. 83
-
-
Srivastava, S.K.1
Krishnakumar, E.2
De Souza, A.C.3
-
50
-
-
85034307494
-
-
P. Haaland, Technical Report AFWAL-TR-88-2043, Aero Propulsion Laboratory, U. S. Air Force Wright Aeronautical Laboratory, Wright Patterson Air Force Base, Ohio, 1988
-
P. Haaland, Technical Report AFWAL-TR-88-2043, Aero Propulsion Laboratory, U. S. Air Force Wright Aeronautical Laboratory, Wright Patterson Air Force Base, Ohio, 1988.
-
-
-
-
52
-
-
0001841364
-
-
A. Matsuda, K. Nomoto, Y. Takeuchi, A. Suzuki, A. Yuuki, and J. Perrin, Surf. Sci. 227, 50 (1990).
-
(1990)
Surf. Sci.
, vol.227
, pp. 50
-
-
Matsuda, A.1
Nomoto, K.2
Takeuchi, Y.3
Suzuki, A.4
Yuuki, A.5
Perrin, J.6
-
54
-
-
0001435806
-
-
D. A. Doughty, J. R. Doyle, G. H. Lin, and A. Gallagher, J. Appl. Phys. 67, 6220 (1990).
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 6220
-
-
Doughty, D.A.1
Doyle, J.R.2
Lin, G.H.3
Gallagher, A.4
-
55
-
-
0032351436
-
-
Ph.D. thesis, University Paris-Sud
-
P. Kae-Nune, Ph.D. thesis, University Paris-Sud, 1995; J. Perrin, M. Shiratani, P. Kae-Nune, H. Videlot, J. Jolly, and J. Guillon, J. Vac. Sci. Technol. A 16, 278 (1998).
-
(1995)
-
-
Kae-Nune, P.1
-
56
-
-
0032351436
-
-
P. Kae-Nune, Ph.D. thesis, University Paris-Sud, 1995; J. Perrin, M. Shiratani, P. Kae-Nune, H. Videlot, J. Jolly, and J. Guillon, J. Vac. Sci. Technol. A 16, 278 (1998).
-
(1998)
J. Vac. Sci. Technol. A
, vol.16
, pp. 278
-
-
Perrin, J.1
Shiratani, M.2
Kae-Nune, P.3
Videlot, H.4
Jolly, J.5
Guillon, J.6
-
57
-
-
85034283679
-
-
Ph.D. thesis, Université Scientifique, Technologique et Medicale de Grenoble, France
-
A. Radouani, Ph.D. thesis, Université Scientifique, Technologique et Medicale de Grenoble, France, 1986.
-
(1986)
-
-
Radouani, A.1
-
59
-
-
36549102861
-
-
Ph.D. thesis, Nagoya University
-
J. M. Jasinski and J. O. Chu, J. Chem. Phys. 88, 1678 (1988); H. Nomura, Ph.D. thesis, Nagoya University, 1996.
-
(1996)
-
-
Nomura, H.1
-
64
-
-
0026120313
-
-
A. Matsuda, Plasma Phys. Controlled Fusion 39, A431 (1997); J.-L. Guizot, K. Nomoto, and A. Matsuda, Surf. Sci. 244, 22 (1991).
-
(1991)
Surf. Sci.
, vol.244
, pp. 22
-
-
Guizot, J.-L.1
Nomoto, K.2
Matsuda, A.3
-
65
-
-
36549102473
-
-
A. Gallagher, J. Appl. Phys. 63, 2406 (1988); R. Robertson and A. Gallagher, ibid. 59, 3402 (1986); R. Robertson, D. Hills, H. Chatham, and A. Gallagher, Appl. Phys. Lett. 43, 544 (1983).
-
(1988)
J. Appl. Phys.
, vol.63
, pp. 2406
-
-
Gallagher, A.1
-
66
-
-
0347387997
-
-
A. Gallagher, J. Appl. Phys. 63, 2406 (1988); R. Robertson and A. Gallagher, ibid. 59, 3402 (1986); R. Robertson, D. Hills, H. Chatham, and A. Gallagher, Appl. Phys. Lett. 43, 544 (1983).
-
(1986)
J. Appl. Phys.
, vol.59
, pp. 3402
-
-
Robertson, R.1
Gallagher, A.2
-
67
-
-
36749115049
-
-
A. Gallagher, J. Appl. Phys. 63, 2406 (1988); R. Robertson and A. Gallagher, ibid. 59, 3402 (1986); R. Robertson, D. Hills, H. Chatham, and A. Gallagher, Appl. Phys. Lett. 43, 544 (1983).
-
(1983)
Appl. Phys. Lett.
, vol.43
, pp. 544
-
-
Robertson, R.1
Hills, D.2
Chatham, H.3
Gallagher, A.4
-
68
-
-
0027906879
-
-
G. Ganguly and A. Matsuda, J. Non-Cryst. Solids 164/166, 31 (1993); Jpn. J. Appl. Phys., Part 2 31, L1269 (1992); Mater. Res. Soc. Symp. Proc. 258, 39 (1992); Phys. Rev. B 47, 3661 (1993).
-
(1993)
J. Non-Cryst. Solids
, vol.164-166
, pp. 31
-
-
Ganguly, G.1
Matsuda, A.2
-
69
-
-
0026918559
-
-
G. Ganguly and A. Matsuda, J. Non-Cryst. Solids 164/166, 31 (1993); Jpn. J. Appl. Phys., Part 2 31, L1269 (1992); Mater. Res. Soc. Symp. Proc. 258, 39 (1992); Phys. Rev. B 47, 3661 (1993).
-
(1992)
Jpn. J. Appl. Phys., Part 2
, vol.31
-
-
-
70
-
-
0027906879
-
-
G. Ganguly and A. Matsuda, J. Non-Cryst. Solids 164/166, 31 (1993); Jpn. J. Appl. Phys., Part 2 31, L1269 (1992); Mater. Res. Soc. Symp. Proc. 258, 39 (1992); Phys. Rev. B 47, 3661 (1993).
-
(1992)
Mater. Res. Soc. Symp. Proc.
, vol.258
, pp. 39
-
-
-
71
-
-
0000769887
-
-
G. Ganguly and A. Matsuda, J. Non-Cryst. Solids 164/166, 31 (1993); Jpn. J. Appl. Phys., Part 2 31, L1269 (1992); Mater. Res. Soc. Symp. Proc. 258, 39 (1992); Phys. Rev. B 47, 3661 (1993).
-
(1993)
Phys. Rev. B
, vol.47
, pp. 3661
-
-
-
72
-
-
0026415408
-
-
M. Vanecek, B. P. Nelson, A. H. Mahan, and R. S. Crandall, J. Non-Cryst. Solids 137/138, 191 (1991); A. H. Mahan, J. Carapella, B. P. Nelson, R. S. Crandall, and I. Balberg, J. Appl. Phys. 69, 6728 (1991).
-
(1991)
J. Non-Cryst. Solids
, vol.137-138
, pp. 191
-
-
Vanecek, M.1
Nelson, B.P.2
Mahan, A.H.3
Crandall, R.S.4
-
73
-
-
0242278038
-
-
M. Vanecek, B. P. Nelson, A. H. Mahan, and R. S. Crandall, J. Non-Cryst. Solids 137/138, 191 (1991); A. H. Mahan, J. Carapella, B. P. Nelson, R. S. Crandall, and I. Balberg, J. Appl. Phys. 69, 6728 (1991).
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 6728
-
-
Mahan, A.H.1
Carapella, J.2
Nelson, B.P.3
Crandall, R.S.4
Balberg, I.5
-
74
-
-
36449009023
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1993)
J. Chem. Phys.
, vol.99
, pp. 5619
-
-
Koleske, D.D.1
Gates, S.M.2
Jackson, B.3
-
75
-
-
0000083104
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1994)
J. Chem. Phys.
, vol.101
, pp. 3301
-
-
-
76
-
-
0348212564
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1995)
Phys. Rev. Lett.
, vol.74
, pp. 2074
-
-
Widdra, W.1
Yi, S.I.2
Maboudian, R.3
Briggs, G.A.D.4
Weinberg, W.H.5
-
77
-
-
0031273619
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1997)
J. Phys. Chem. B
, vol.101
, pp. 9537
-
-
Chiang, C.-M.1
Gates, S.M.2
Lee, S.S.3
Kong, M.4
Bent, S.F.5
-
78
-
-
0000403076
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1996)
J. Chem. Phys.
, vol.105
, pp. 2066
-
-
Buntin, S.A.1
-
79
-
-
0001126367
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 456
-
-
Srinivasan, E.1
Parsons, G.N.2
-
80
-
-
0001305433
-
-
D. D. Koleske, S. M. Gates, and B. Jackson, J. Chem. Phys. 99, 5619 (1993); ibid. 101, 3301 (1994); W. Widdra, S. I. Yi, R. Maboudian, G. A. D. Briggs, and W. H. Weinberg, Phys. Rev. Lett. 74, 2074 (1995); C.-M. Chiang, S. M. Gates, S. S. Lee, M. Kong, and S. F. Bent, J. Phys. Chem. B 101 9537 (1997); S. A. Buntin, J. Chem. Phys. 105, 2066 (1996); E. Srinivasan and G. N. Parsons, Appl. Phys. Lett. 72, 456 (1998); Y. Muramatsu and N. Yabumoto, ibid. 49, 1230 (1986).
-
(1986)
Appl. Phys. Lett.
, vol.49
, pp. 1230
-
-
Muramatsu, Y.1
Yabumoto, N.2
-
81
-
-
0347387997
-
-
R. Robertson and A. Gallagher, J. Appl. Phys. 59, 3402 (1986); R. Robertson, D. Hills, H. Chatham, and A. Gallagher, Appl. Phys. Lett. 43, 544 (1983).
-
(1986)
J. Appl. Phys.
, vol.59
, pp. 3402
-
-
Robertson, R.1
Gallagher, A.2
-
82
-
-
36749115049
-
-
R. Robertson and A. Gallagher, J. Appl. Phys. 59, 3402 (1986); R. Robertson, D. Hills, H. Chatham, and A. Gallagher, Appl. Phys. Lett. 43, 544 (1983).
-
(1983)
Appl. Phys. Lett.
, vol.43
, pp. 544
-
-
Robertson, R.1
Hills, D.2
Chatham, H.3
Gallagher, A.4
-
83
-
-
0001132517
-
-
P. A. Longeway, H. A. Weakliem, and R. D. Estes, J. Appl. Phys. 57, 5499 (1985); P. A. Longeway, R. D. Estes, and H. A. Weakliem, J. Phys. Chem. 88, 73 (1994).
-
(1985)
J. Appl. Phys.
, vol.57
, pp. 5499
-
-
Longeway, P.A.1
Weakliem, H.A.2
Estes, R.D.3
-
84
-
-
5244261488
-
-
P. A. Longeway, H. A. Weakliem, and R. D. Estes, J. Appl. Phys. 57, 5499 (1985); P. A. Longeway, R. D. Estes, and H. A. Weakliem, J. Phys. Chem. 88, 73 (1994).
-
(1994)
J. Phys. Chem.
, vol.88
, pp. 73
-
-
Longeway, P.A.1
Estes, R.D.2
Weakliem, H.A.3
-
86
-
-
0000676645
-
-
G. J. Nienhuis, W. J. Goedheer, E. A. G. Hamers, W. G. J. H. M. van Sark, and J. Bezemer, J. Appl. Phys. 82, 2060 (1997).
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 2060
-
-
Nienhuis, G.J.1
Goedheer, W.J.2
Hamers, E.A.G.3
Van Sark, W.G.J.H.M.4
Bezemer, J.5
-
87
-
-
0000981416
-
-
J. R. Doyle, D. A. Doughty, and A. Gallagher, J. Appl. Phys. 68, 4375 (1990); 71, 4771 (1992).
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 4375
-
-
Doyle, J.R.1
Doughty, D.A.2
Gallagher, A.3
-
88
-
-
0005989981
-
-
J. R. Doyle, D. A. Doughty, and A. Gallagher, J. Appl. Phys. 68, 4375 (1990); 71, 4771 (1992).
-
(1992)
J. Appl. Phys.
, vol.71
, pp. 4771
-
-
-
89
-
-
0002050867
-
-
S. Veprek and M. Heintze, Plasma Chem. Plasma Process. 10, 3 (1990); S. Veprek and M. G. J. Veprek-Heijman, ibid. 11, 335 (1991); Appl. Phys. Lett. 56, 1766 (1990); S. Veprek, Thin Solid Films 175, 129 (1989).
-
(1990)
Plasma Chem. Plasma Process.
, vol.10
, pp. 3
-
-
Veprek, S.1
Heintze, M.2
-
90
-
-
0002050867
-
-
S. Veprek and M. Heintze, Plasma Chem. Plasma Process. 10, 3 (1990); S. Veprek and M. G. J. Veprek-Heijman, ibid. 11, 335 (1991); Appl. Phys. Lett. 56, 1766 (1990); S. Veprek, Thin Solid Films 175, 129 (1989).
-
(1991)
Plasma Chem. Plasma Process.
, vol.11
, pp. 335
-
-
Veprek, S.1
Veprek-Heijman, M.G.J.2
-
91
-
-
0039945184
-
-
S. Veprek and M. Heintze, Plasma Chem. Plasma Process. 10, 3 (1990); S. Veprek and M. G. J. Veprek-Heijman, ibid. 11, 335 (1991); Appl. Phys. Lett. 56, 1766 (1990); S. Veprek, Thin Solid Films 175, 129 (1989).
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 1766
-
-
-
92
-
-
0024718404
-
-
S. Veprek and M. Heintze, Plasma Chem. Plasma Process. 10, 3 (1990); S. Veprek and M. G. J. Veprek-Heijman, ibid. 11, 335 (1991); Appl. Phys. Lett. 56, 1766 (1990); S. Veprek, Thin Solid Films 175, 129 (1989).
-
(1989)
Thin Solid Films
, vol.175
, pp. 129
-
-
Veprek, S.1
|