Investigations into local piezoelectric properties by atomic force microscopy

Applied Physics Letters

Volumn 76, Issue 3, 2000, Pages 366-368

  Durkan, C ^a   Chu, D P ^a   Migliorato, P ^a   Welland, M E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000770418     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125756     Document Type: Article

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