Scanning tunneling microscopy/spectroscopy observation of intrinsic hydrogenated amorphous silicon surface under light irradiation

Surface Science

Volumn 572, Issue 2-3, 2004, Pages 449-458

  Arima, Kenia ^a   Kakiuchi, Hiroaki ^a   Ikeda, Manabu ^a   Endo, Katsuyoshi ^a   Morita, Mizuho ^a   Mori, Yuzo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Amorphous surfaces; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Silicon; Surface photovoltage; Surface structure, morphology, roughness, and topography; X ray photoelectron spectroscopy

Indexed keywords

HYDROGEN; MORPHOLOGY; PHOTOVOLTAIC EFFECTS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SURFACE TOPOGRAPHY;

AMORPHOUS SURFACES; SCANNING TUNNELING SPECTROSCOPIES; SURFACE PHOTOVOLTAGE; TUNNELING CURRENT;

AMORPHOUS SILICON;

EID: 9744226552     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.09.028     Document Type: Article

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