Atomic-scale scanning tunneling microscopy of amorphous surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 16, 1999, Pages 10895-10902

  Burgler D E ^a   Schmidt, C M ^a   Schaller, D M ^a   Meisinger, F ^a   Schaub, T M ^a   Baratoff, A ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001702009     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.10895     Document Type: Article

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