Visible light irradiation effects on STM observations of hydrogenated amorphous silicon surfaces

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 4 B, 2004, Pages 1891-1895

  Arima, Kenta ^a   Kakiuchi, Hiroaki ^a   Ikeda, Manabu ^a   Endo, Katsuyoshi ^a   Morita, Mizuho ^a   Mori, Yuzo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Hydrogenated amorphous silicon; Photoexcitation; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Surface structure; Visible light irradiation; Wet cleaning

Indexed keywords

ELECTRONIC STRUCTURE; ELECTRONS; HYDROGEN; HYDROGENATION; IRRADIATION; PROBES; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTIES; SURFACE STRUCTURE;

HYDROGENATED AMORPHOUS SILICON; PHOTOEXCITATION; VISIBLE LIGHT IRRADIAITON; WET CLEANING;

AMORPHOUS SILICON;

EID: 3142666296     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.1891     Document Type: Conference Paper

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