Atomically resolved scanning tunneling microscopy of hydrogen-terminated Si(001) surfaces after HF cleaning

Applied Physics Letters

Volumn 76, Issue 4, 2000, Pages 463-465

  Arima, Kenta ^a   Endo, Katsuyoshi ^a   Kataoka, Toshihiko ^a   Oshikane, Yasushi ^a   Inoue, Haruyuki ^a   Mori, Yuzo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001599960     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125788     Document Type: Article

References (12)

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