High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry

International Journal of Mass Spectrometry

Volumn 377, Issue 1, 2015, Pages 591-598

  Angerer, Tina B ^a   Blenkinsopp, Paul ^b   Fletcher, John S ^a  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b IONOPTIKA LTD   (United Kingdom)

Author keywords

Gas cluster ion beams; High energy; Imaging; Irganox; Mouse brain; Spectrometry (ToF SIMS); Time of flight secondary ion mass

Indexed keywords

EID: 85028226753     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2014.05.015     Document Type: Article

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