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Volumn 85, Issue 16, 2013, Pages 7745-7752

Argon cluster ion source evaluation on lipid standards and rat brain tissue samples

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL IMAGING; CHEMICAL COMPOSITIONS; DUAL-BEAM DEPTH PROFILING; MATRIX EFFECTS; ORGANIC MATERIALS; RAT BRAIN TISSUE; SPUTTERING YIELDS; STATIC SECONDARY ION MASS SPECTROMETRIES;

EID: 84882608573     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac4009513     Document Type: Article
Times cited : (79)

References (38)
  • 9
    • 0141765263 scopus 로고    scopus 로고
    • TOF-SIMS-an overview
    • Vickerman, J. C. Briggs, D. Surface Spectra and IM Publications: Manchester and Chichester
    • Vickerman, J. C. TOF-SIMS-an overview. In ToF-SIMS-Surface Analysis by Mass Spectrometry; Vickerman, J. C.; Briggs, D., Eds.; Surface Spectra and IM Publications: Manchester and Chichester, 2001; pp 1-40.
    • (2001) ToF-SIMS-Surface Analysis by Mass Spectrometry , pp. 1-40
    • Vickerman, J.C.1
  • 10
    • 84882582035 scopus 로고    scopus 로고
    • Role of operating conditions in ToF-SIMS
    • second ed. Vickerman, J. C. Briggs, D. Surface Spectra and IM Publications: Manchester and Chichester, in press
    • Gilmore, I. S. Role of operating conditions in ToF-SIMS. In TOF-SIMS Surface Analysis by Mass Spectrometry, second ed.; Vickerman, J. C.; Briggs, D., Eds.; Surface Spectra and IM Publications: Manchester and Chichester, in press.
    • TOF-SIMS Surface Analysis by Mass Spectrometry
    • Gilmore, I.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.