Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

Applied Surface Science

Volumn 174, Issue 3-4, 2001, Pages 261-270

  Stapel, D ^a   Benninghoven, A ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Polymer surfaces; Static secondary ion mass spectrometry (SIMS); Time of flight mass spectrometer

Indexed keywords

ADDITION REACTIONS; ARGON; CARBON DIOXIDE; OXYGEN; SECONDARY ION MASS SPECTROMETRY; XENON;

TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

POLYETHYLENES;

EID: 0035971445     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00173-8     Document Type: Article

References (15)