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Volumn 48, Issue 5, 2001, Pages 1688-1693

Comprehensive Modeling of Bulk-Damage Effects in Silicon Radiation Detectors

Author keywords

Radiation damage; silicon detectors

Indexed keywords


EID: 85008040601     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.960358     Document Type: Article
Times cited : (40)

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