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Volumn 2003-September, Issue , 2003, Pages 451-455

The SIRAD irradiation facility for bulk damage and single event effect studies

Author keywords

[No Author keywords available]

Indexed keywords

HIGH ENERGY PHYSICS; LASER DAMAGE; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SPACE APPLICATIONS;

EID: 84995543614     PISSN: 03796566     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (19)
  • 4
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    • Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons
    • J. Wyss, D. Bisello, A. Candelori, A. Kaminsky, and D. Pantano, "Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons", Nucl. Instr. Meth., vol. A 457, pp. 595-600, 2001.
    • (2001) Nucl. Instr. Meth. , vol.A 457 , pp. 595-600
    • Wyss, J.1    Bisello, D.2    Candelori, A.3    Kaminsky, A.4    Pantano, D.5
  • 5
    • 0035428525 scopus 로고    scopus 로고
    • Radiation damage of standard and oxygenated silicon diodes irradiated by 16 MeV and 27 MeV protons
    • D. Bisello, J. Wyss, A. Candelori, A. Kaminsky, and D. Pantano, "Radiation damage of standard and oxygenated silicon diodes irradiated by 16 MeV and 27 MeV protons", IEEE Trans. Nucl. Sci., vol. 48, pp. 1020-1026, 2001.
    • (2001) IEEE Trans. Nucl. Sci. , vol.48 , pp. 1020-1026
    • Bisello, D.1    Wyss, J.2    Candelori, A.3    Kaminsky, A.4    Pantano, D.5
  • 7
    • 0033312210 scopus 로고    scopus 로고
    • A model of radiation induced leakage current (RILC) in ultra-thin gate oxides
    • L. Larcher, A. Paccagnella, M. Ceschia and G. Ghidini, "A model of radiation induced leakage current (RILC) in ultra-thin gate oxides", IEEE Trans-Nucl. Sci., vol. 46, pp. 1553-1561, 1999.
    • (1999) IEEE Trans-Nucl. Sci. , vol.46 , pp. 1553-1561
    • Larcher, L.1    Paccagnella, A.2    Ceschia, M.3    Ghidini, G.4
  • 8
    • 0034205654 scopus 로고    scopus 로고
    • Low field leakage current and soft beakdown in ultra-thin gate oxides after heavy ions, electrons or X-ray irradiation
    • M. Ceschia, A. Paccagnella, S. Sandrin, G. Ghidini, S. Wyss, M. Lavale et al., "Low field leakage current and soft beakdown in ultra-thin gate oxides after heavy ions, electrons or X-ray irradiation", IEEE Trans. Nucl. Sci., vol. 47, pp. 566-573, 2000.
    • (2000) IEEE Trans. Nucl. Sci. , vol.47 , pp. 566-573
    • Ceschia, M.1    Paccagnella, A.2    Sandrin, S.3    Ghidini, G.4    Wyss, S.5    Lavale, M.6
  • 12
    • 0035720550 scopus 로고    scopus 로고
    • Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxides
    • A. Cester, L. Bandicra, M. Ceschia, G. Ghidini and A. Paccagnella, "Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxides", IEEE Trans. Nucl. Sci., vol. 48, pp. 2093-2099, 2001.
    • (2001) IEEE Trans. Nucl. Sci. , vol.48 , pp. 2093-2099
    • Cester, A.1    Bandicra, L.2    Ceschia, M.3    Ghidini, G.4    Paccagnella, A.5
  • 17
    • 0033338226 scopus 로고    scopus 로고
    • A new approach to nuclear microscopy: The ion-electron emission microscope
    • B. L. Doyle, G. Vizkelethy, D. S. Walsh, B. Senftiger, M. Mellon, "A new approach to nuclear microscopy: the ion-electron emission microscope", Nucl. Instr. Meth., vol. B 158, pp. 6-17, 1999.
    • (1999) Nucl. Instr. Meth. , vol.B 158 , pp. 6-17
    • Doyle, B.L.1    Vizkelethy, G.2    Walsh, D.S.3    Senftiger, B.4    Mellon, M.5
  • 18
    • 0035387761 scopus 로고    scopus 로고
    • Ion electron emission microscopy at the SIRAD single event effect facility
    • D. Bisello et al., "Ion electron emission microscopy at the SIRAD single event effect facility", Nucl. Instr. Meth., vol. B181, pp. 254-257, 2001.
    • (2001) Nucl. Instr. Meth. , vol.B181 , pp. 254-257
    • Bisello, D.1
  • 19
    • 0043014927 scopus 로고    scopus 로고
    • Status of the ion electron emission microscope at the SIRAD single event facility
    • proceedings of ICNMTA 2002 Takasaki, Japan
    • D. Bisello, A. Candelori, M. Dal Maschio, P. Giubilato, A. Kaminsky, et al., "Status of the ion electron emission microscope at the SIRAD single event facility", to be published in Nucl. Instr. Meth., vol. B (2003), proceedings of ICNMTA 2002 (Takasaki, Japan).
    • (2003) Nucl. Instr. Meth. , vol.B
    • Bisello, D.1    Candelori, A.2    Dal Maschio, M.3    Giubilato, P.4    Kaminsky, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.