Single event upset studies on the CMS tracker APV25 readout chip

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 492, Issue 3, 2002, Pages 434-450

  Noah, E ^a   Bauer, T ^b   Bisello, D ^c,d   Faccio, F ^e   Friedl, M ^b   Fulcher, J R ^a   Hall, G ^a   Huhtinen, M ^e   Kaminsky, A ^c,d   Pernicka, M ^b   Raymond, M ^a   Wyss, J ^c,d  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b INSTITUT FÜR HOCHENERGIEPHYSIK   (Austria)

^c SEZIONE DI PADOVA   (Italy)

^d UNIVERSITY OF PADOVA   (Italy)

^e CERN   (Switzerland)

Author keywords

APV25; CMS silicon tracker; Front end electronics; Radiation tolerance; SEU; Single event upset

Indexed keywords

ION BEAMS; IRRADIATION; MICROPROCESSOR CHIPS; PROTONS; READOUT SYSTEMS;

RADIATION TOLERANCE;

NUCLEAR INSTRUMENTATION;

EID: 0037152356     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01356-6     Document Type: Article

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