Ion beam testing of SRAM-based FPGA's

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn 1, Issue 2, 2002, Pages 474-480

  Bellato, M ^a,b   Ceschia, M ^a   Menichelli, M ^c   Papi, A ^c   Wyss, J ^a,b   Paccagnella, A ^a,b  

^a UNIVERSITY OF PADOVA   (Italy)

^b SEZIONE DI PADOVA   (Italy)

^c INFN SEZIONE DI PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; HEAVY IONS; INTEGRATED CIRCUIT TESTING; ION BEAMS; IRRADIATION; RADIATION EFFECTS; RANDOM ACCESS STORAGE; SHIFT REGISTERS;

CMOS TECHNOLOGY; DEVICES UNDER TEST; ION BEAM TESTING; SINGLE EVENT FUNCTIONAL INTERRUPT; STATIC RANDOM ACCESS MEMORY; TRIPLE MODULAR REDUNDANT SHIFT REGISTERS;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0036992534     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. J. J. Wang et al., "SRAM Based Re-programmable FPGA for Space Applications", IEEE Trans. Nucl. Sci., vo. 46, no. 6, pp. 1728-1735, Dec. 1999
2. E. Fuller et al., "Radiation Characterization, and SEU Mitigation, of the Virtex FPGA for Space-Based Reconfigurable Computing" to be published on IEEE Trans. Nucl. Sci. Dec. 2000 (presented during the 2000 NSREC, Reno, Nevada, July 2000)
3. M. Ohlsson et al., "Neutron Single Event Upset in SRAM-BASED FPGAs", 1998 IEEE Radiation Effects Data Workshop Record, Newport Beach, California July 24, 1998, pp. 177-180.
4. R. Katz et al., "Radiation Effects on Current Field Programmable Technologies", IEEE Trans. on Nucl. Sci., vol. 44, no. 6, pp. 1945-1956, Dec. 1997
5. R. Katz et al., "Current Radiation Issues for Programmable Elements and Devices", IEEE Trans. on Nucl. Sci., vol. 45, no. 6, pp. 2600-2610, Dec. 1998
6. L. Hoffmann et al., "Radiation Effects Testing of Programmable Logic Devices (PLDs)", 2000 IEEE NSREC Short Course, July 24, 2000.