Ion electron emission microscopy at the SIRAD single event effect facility

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 181, Issue 1-4, 2001, Pages 254-257

  Bisello, D ^a   Kaminsky, A ^a   Magalini, A ^a   Nigro, M ^a   Pantano, D ^a   Sedykh, S ^b   Wyss, J ^c  

^a UNIVERSITY OF PADOVA   (Italy)

^b JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

^c UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

Ion electron emission microscopy; Single event effects

Indexed keywords

ELECTRON MICROSCOPES; ENERGY TRANSFER; IMAGING TECHNIQUES; MAGNETIC FIELD EFFECTS; PARTICLE ACCELERATORS; SEMICONDUCTOR DEVICES;

ION ELECTRON EMISSION MICROSCOPY;

ELECTRON EMISSION;

EID: 0035387761     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00462-1     Document Type: Conference Paper

References (12)