High-resolution kelvin probe force microscopy imaging of interface dipoles and photogenerated charges in organic donor-Acceptor photovoltaic blends

ACS Nano

Volumn 10, Issue 1, 2016, Pages 739-746

  Fuchs, Franz ^a,b,c,e   Caffy, Florent ^a,b,c   Demadrille, Renaud ^a,b,c   Mélin, Thierry ^d   Grévin, Benjamin ^a,b,c  

^a UNIV GRENOBLE ALPES   (France)

^b INAC SPrAM   (France)

^c CEA GRENOBLE   (France)

^d INSTITUT D ELECTRONIQUE   (France)

^e Lithium Energy and Power GmbH Co KG   (Germany)

Author keywords

Donor Acceptor interfaces; KPFM; NC AFM; Organic photovoltaics; Surface photovoltage

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC FIELDS; KETONES; PROBES; SURFACE PROPERTIES;

CONTACT POTENTIAL DIFFERENCE; DONOR-ACCEPTOR INTERFACES; ELECTROSTATIC SIMULATIONS; KELVIN PROBE FORCE MICROSCOPY; KPFM; NONCONTACT ATOMIC FORCE MICROSCOPY; ORGANIC PHOTOVOLTAICS; SURFACE PHOTOVOLTAGES;

BUTYRIC ACID;

EID: 84991065633     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b05810     Document Type: Article

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