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Volumn 219, Issue 2, 2005, Pages 57-65

Test bed for mechanical characterization of nanowires

Author keywords

in situ testing; MEMS; nanowires; zinc oxide

Indexed keywords


EID: 84990365420     PISSN: 17403499     EISSN: 20413092     Source Type: Journal    
DOI: 10.1243/17403499JNN42     Document Type: Article
Times cited : (9)

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