An integrated MEMS system for in-situ mechanical testing of nanostructures

Proceedings of the 3rd ASME Integrated Nanosystems Conference - Design, Synthesis, and Applications

Volumn , Issue , 2004, Pages 119-120

  Lu, Shaoning ^a   Chung, Jaehyun ^a   Dikin, Dima ^a   Lee, Junghoon ^a   Ruoff, Rodney S ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CARBON NANOTUBES; ELECTROMECHANICAL DEVICES; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

COMPRESSIVE LOADING; NANOSTRUCTURE TESTING; NANOSTRUCTURES; STRUCTURAL STABILITY;

NANOSTRUCTURED MATERIALS;

EID: 21244455232     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/nano2004-46067     Document Type: Conference Paper

References (3)

1. Yu, M. F., Files, B. S., Arepalli, S., Ruoff, R. S., Physical Review Letters, 2000. 84(24): p. 5552-5555.
2. Yu, M. F., Lourie, O., Dyer, M. J., Moloni, K., Kelly, T. F., Ruoff, R. S., Science, 2000. 287(5453): p. 637-640.
3. Saif, M. T. A., Zhang, S., Haque, M. A., Hsia, K. J., Acta Materialia, 2002. 50: p. 2779-2786.