Electromechanical properties of metallic, quasimetallic, and semiconducting carbon nanotubes under stretching

Physical Review Letters

Volumn 90, Issue 15, 2003, Pages

  Cao, Jien ^a   Wang, Qian ^a   Dai, Hongjie ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTROMECHANICAL DEVICES; ENERGY GAP; GAGES; PIEZOELECTRIC DEVICES; POLYSILICON; SCANNING ELECTRON MICROSCOPY; STRAIN; STRETCHING; TENSILE PROPERTIES;

PIEZORESISTIVE GAGE; QUASIMETALLIC NANOTUBES; SEMICONDUCTING CARBON NANOTUBES; SINGLE WALLED CARBON NANOTUBES;

CARBON NANOTUBES;

EID: 0038201845     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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