Preferential orientation, microstructure and functional properties of SnO 2 :Sb thin film: The effects of post-growth annealing

Applied Surface Science

Volumn 362, Issue , 2016, Pages 230-236

  Zheng, Haoran ^a   Li, Lingxia ^a   Sun, Zheng ^a   Yu, Shihui ^a   Luo, Weijia ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

FE SEM; Magnetron sputtering; Preferential orientation; Thin films; Transparent conducting oxides

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; CONDUCTIVE FILMS; CRYSTALLINE MATERIALS; FILM GROWTH; GRAIN GROWTH; HALL MOBILITY; MAGNETRON SPUTTERING; MICROSTRUCTURE; OPTICAL PROPERTIES; OXIDE MINERALS; TITANIUM DIOXIDE; TRANSPARENT CONDUCTING OXIDES;

ABNORMAL GRAIN GROWTH; ANNEALING TEMPERATURES; CRYSTALLOGRAPHIC ORIENTATIONS; ELECTRICAL AND OPTICAL PROPERTIES; FUNCTIONAL PROPERTIES; POSTGROWTH ANNEALING; PREFERENTIAL ORIENTATION; VISIBLE-WAVELENGTH RANGE;

THIN FILMS;

EID: 84959482785     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2015.11.230     Document Type: Article

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