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Applied Physics Letters

Volumn 103, Issue 3, 2013, Pages

Correlation between defects and conductivity of Sb-doped tin oxide thin films

(4) Mao, Wenfeng a Xiong, Bangyun a Liu, Yong a He, Chunqing a

a WUHAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALCINATION TEMPERATURE; CARRIER SCATTERING; DOPED TIN OXIDES; LINE SHAPE PARAMETERS; RESIDUAL DEFECTS; SB-DOPED TIN OXIDE; SLOW POSITRON BEAM; UNDOPED FILMS;

DOPING (ADDITIVES); OXIDE FILMS; SOL-GEL PROCESS; THIN FILMS; TIN;

DEFECTS;

EID: 84881508280 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4816084 Document Type: Article

Times cited : (34)

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