Imprinting a focused X-ray laser beam to measure its full spatial characteristics

Physical Review Applied

Volumn 4, Issue 1, 2015, Pages

  Chalupsky J ^a   Bohacek P ^a   Burian, T ^a   Hajkova V ^a   Hau Riege, S P ^b   Heimann, P A ^c   Juha, L ^a   Messerschmidt, M ^c   Moeller, S P ^c   Nagler, B ^c   Rowen, M ^c   Schlotter, W F ^c   Swiggers, M L ^c   Turner, J J ^c   Krzywinski, J ^c  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; ESTERS; FREE ELECTRON LASERS; ITERATIVE METHODS; LEAD COMPOUNDS; NUMERICAL METHODS; TUNGSTEN COMPOUNDS; X RAY LASERS; X RAYS;

COHERENCE OPTIMIZATION; GERCHBERG-SAXTON ALGORITHM; LINAC COHERENT LIGHT SOURCE; RADIATION INTENSITY; SPATIAL CHARACTERISTICS; SPATIAL CHARACTERIZATION; TRANSVERSE COHERENCE; X-RAY FREE ELECTRON LASERS;

LASER BEAMS;

EID: 84951326108     PISSN: None     EISSN: 23317019     Source Type: Journal    
DOI: 10.1103/PhysRevApplied.4.014004     Document Type: Article

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