Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

Optics Express

Volumn 15, Issue 10, 2007, Pages 6036-6043

  Chalupsky J ^a,b   Juha, L ^a   Kuba, J ^b   Cihelka, J ^a,c,d   Hajkova V ^a   Koptyaev, S ^a   Krasa J ^a   Velyhan, A ^a   Bergh, M ^e   Caleman, C ^e   Hajdu, J ^e   Bionta, R M ^f   Chapman, H ^f   Hau Riege, S P ^f   London, R A ^f   Jurek, M ^g   Krzywinski, J ^g   Nietubyc, R ^h   Pelka, J B ^g   Sobierajski, R ^g   Meyer ter Vehn, J ⁱ   Tronnier, A ⁱ   Sokolowski Tinten, K ^j   Stojanovic, N ^j   Tiedtke, K ^k   Toleikis, S ^k   Tschentscher, T ^k   Wabnitz, H ^k   Zastrau, U ^l   more..

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^c J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY   (Czech Republic)

^d CHARLES UNIVERSITY   (Czech Republic)

^e UPPSALA UNIVERSITY   (Sweden)

^f LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^g INSTITUTE OF PHYSICS   (Poland)

^h SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

ⁱ MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^j UNIVERSITY OF DUISBURG ESSEN   (Germany)

^k DESY   (Germany)

^l FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

more..

Author keywords

[No Author keywords available]

Indexed keywords

FREE ELECTRON LASERS; LASER ABLATION; LINEAR ACCELERATORS; POLYMETHYL METHACRYLATES; ULTRASHORT PULSES; X RAY ANALYSIS;

ABLATION PARAMETERS; ORGANIC MOLECULAR SOLIDS; TRANSVERSE INTENSITY DISTRIBUTION; X RAY FREE ELECTRON LASER BEAMS;

LASER BEAMS;

EID: 34248551894     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.006036     Document Type: Article

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