X-ray holographic microscopy by means of photoresist recording and atomic-force microscope readout

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 13, Issue 9, 1996, Pages 1788-1800

  Lindaas, Steve ^a   Howells, Malcolm ^a   Jacobsen, Chris ^b   Kalinovsky, Alex ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85010163391     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.13.001788     Document Type: Article

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