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Volumn 175, Issue , 2016, Pages 100-112

Characterization of the surface charge distribution on kaolinite particles using high resolution atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROKINESIS; EXPERIMENTAL MINERALOGY; KAOLINITE; NANOPARTICLE;

EID: 84951018245     PISSN: 00167037     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.gca.2015.12.003     Document Type: Article
Times cited : (81)

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