Evaluation of surface ionization parameters from AFM data

Journal of Colloid and Interface Science

Volumn 207, Issue 2, 1998, Pages 332-343

  Zhmud, B V ^a   Meurk, A ^a   Bergstrom L ^a  

^a INSTITUTE FOR SURFACE CHEMISTRY   (Sweden)

Author keywords

AFM; Charge regulation; DLVO; Silica; Silicon nitride; Surface ionization

Indexed keywords

SILICON DERIVATIVE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; IONIZATION; MOLECULAR INTERACTION; PRIORITY JOURNAL; SURFACE CHARGE; SURFACE PROPERTY;

EID: 0032533179     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.1998.5783     Document Type: Article

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