Analysis of the constant-excitation mode in frequency-modulation atomic force microscopy with active Q-Control applied in ambient conditions and liquids

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Ebeling, D ^a   Holscher H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAPHITE; HIGH TEMPERATURE EFFECTS; VACUUM;

ANALYTICAL SOLUTION; HERTZIAN TIP-SAMPLE FORCE;

FREQUENCY MODULATION;

EID: 37149016050     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817952     Document Type: Article

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