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Volumn 10, Issue 11, 2015, Pages 949-953

Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

BORON NITRIDE; DEFECT STRUCTURES; DRAIN CURRENT; ELECTRONIC STRUCTURE; GRAPHENE; III-V SEMICONDUCTORS; POINT DEFECTS; SCANNING; SCANNING TUNNELING MICROSCOPY; ULTRATHIN FILMS;

EID: 84947045855     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2015.188     Document Type: Article
Times cited : (258)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.