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Volumn 1, Issue , 2014, Pages 571-589

EXAFS and XANES analysis of oxides at the nanoscale

Author keywords

EXAFS; nanocrystalline materials; oxide nanomaterials; XANES

Indexed keywords


EID: 84938576747     PISSN: None     EISSN: 20522525     Source Type: Journal    
DOI: 10.1107/S2052252514021101     Document Type: Article
Times cited : (219)

References (222)
  • 25
    • 84875167472 scopus 로고    scopus 로고
    • X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures
    • 2nd ed., edited by C. Lamberti and G. Agostini. Amsterdam: Elsevier
    • Boscherini, F. (2013). X-ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures. In Characterization of Semiconductor Heterostructures and Nanostructures, 2nd ed., edited by C. Lamberti and G. Agostini. Amsterdam: Elsevier.
    • (2013) Characterization of Semiconductor Heterostructures and Nanostructures
    • Boscherini, F.1
  • 163
    • 0032516694 scopus 로고    scopus 로고
    • Ohno, H. (1998). Science, 281, 951-955.
    • (1998) Science , vol.281 , pp. 951-955
    • Ohno, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.