Determination of the 3D atomic spatial distribution around Mn in (Mn, Zn)O films using multidimensional interpolation of XANES spectra

Solid State Communications

Volumn 149, Issue 41-42, 2009, Pages 1803-1806

  Smolentsev, N ^a   Soldatov, A V ^a   Smolentsev, G ^a   Wei, S Q ^b  

^a SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

A. Semiconductors; C. EXAFS, NEXAFS, SEXAFS; C. Point defects

Indexed keywords

3D STRUCTURE; A. SEMICONDUCTORS; C. EXAFS, NEXAFS, SEXAFS; C. POINT DEFECTS; CUBIC SYMMETRY; HEXAGONAL LATTICE; INTER-ATOMIC DISTANCES; LOCAL STRUCTURE; MN ATOMS; MN-DOPED; MULTIDIMENSIONAL INTERPOLATIONS; NEW OPPORTUNITIES; PULSED LASER; SPATIAL DISTRIBUTION; SPECTRAL FEATURE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES; XANES SPECTRA; ZNO;

ATOMIC SPECTROSCOPY; ATOMS; INTERPOLATION; MANGANESE COMPOUNDS; POINT DEFECTS; PULSED LASER DEPOSITION; SEMICONDUCTOR QUANTUM DOTS; SIZE DISTRIBUTION; THREE DIMENSIONAL; TIN; X RAY ANALYSIS; ZINC; ZINC OXIDE;

MANGANESE;

EID: 69849092337     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.07.016     Document Type: Article

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