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Volumn 91, Issue 4, 2003, Pages

Oxide/metal interface distance and epitaxial strain in the NiO/Ag(001) system

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON EMISSION; EPITAXIAL GROWTH; FILM GROWTH; INTERFACES (MATERIALS); LIGHT ABSORPTION; SILVER; STRAIN;

EID: 84924282139     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (75)

References (23)
  • 17
  • 21
    • 85069259500 scopus 로고    scopus 로고
    • V. R. Saunders et al., CRYSTAL98 User's Manual, University of Torino, 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.