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Volumn 91, Issue 4, 2003, Pages
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Oxide/metal interface distance and epitaxial strain in the NiO/Ag(001) system
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRON EMISSION;
EPITAXIAL GROWTH;
FILM GROWTH;
INTERFACES (MATERIALS);
LIGHT ABSORPTION;
SILVER;
STRAIN;
EPITAXIAL STRAIN;
INTERFACE DISTANCE;
NITROGEN OXIDES;
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EID: 84924282139
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (75)
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References (23)
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