Ultrafast time resolved x-ray diffraction, extended x-ray absorption fine structure and x-ray absorption near edge structure

Journal of Applied Physics

Volumn 112, Issue 3, 2012, Pages

  Oguz Er, Ali ^a   Chen, Jie ^b   Rentzepis, Peter M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT MEASUREMENT; ELECTRON TRANSFER; EXAFS; EXPERIMENTAL METHODS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; HARD X RAY; HIGH SPIN STATE; LIQUID PHASE; OPERATING MECHANISM; POLYCAPILLARY X-RAY LENS; PRESSURE WAVES; REAL TIME; TIME RESOLVED MEASUREMENT; TIME RESOLVED X-RAY DIFFRACTIONS; TIME-RESOLVED; TIO; TRANSIENT PHENOMENON; ULTRA-FAST; ULTRAFAST X-RAY ABSORPTION; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES;

ABSORPTION SPECTRA; ELECTROMAGNETIC PULSE; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; TITANIUM DIOXIDE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

X RAY DIFFRACTION;

EID: 84865220389     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4738372     Document Type: Article

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