X-ray excited optical luminescence detection by scanning near-field optical microscope: A new tool for nanoscience

Review of Scientific Instruments

Volumn 79, Issue 1, 2008, Pages

  Larcheri, Silvia ^a   Rocca, Francesco ^a   Jandard, Frank ^b   Pailharey, Daniel ^b   Graziola, Roberto ^c   Kuzmin, Alexei ^d   Purans, Juris ^d  

^a IFN CNR   (Italy)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c UNIVERSITY OF TRENTO   (Italy)

^d UNIVERSITY OF LATVIA   (Latvia)

Author keywords

[No Author keywords available]

Indexed keywords

LUMINESCENCE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL FIBERS; PHOTODETECTORS; SYNCHROTRON RADIATION; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

COATED OPTICAL FIBER TIP; NANOPOSITIONING SYSTEM; X RAY EXCITED OPTICAL LUMINESCENCE (XEOL) SIGNALS;

NANOSTRUCTURED MATERIALS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; LUMINESCENCE; METHODOLOGY; NANOTECHNOLOGY; OPTICS; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SENSITIVITY AND SPECIFICITY; SPECTROMETRY; SYSTEM ANALYSIS;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LUMINESCENT MEASUREMENTS; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; OPTICS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTROMETRY, X-RAY EMISSION; SYSTEMS INTEGRATION;

EID: 38849152164     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2827485     Document Type: Article

References (39)

1. K. Lahtonen, M. Lampimäki, P. Jussila, M. Hirsimäki, and M. Valdena, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.2221539 77, 083901 (2006).
2. M. Staderman, H. Grube, J. J. Boland, S. J. Papadakis, M. R. Falvo, R. Superfine, and S. Washburn, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1590750 74, 3653 (2003).
3. C. E. Jordan, S. J. Stranick, R. R. Cavanagh, L. J. Richter, and D. B. Chase, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039-6028(99)00069-2 433, 48 (1999).
4. D. Zeisel, V. Deckert, R. Zenobi, and T. Vo-Dinh, Chem. Phys. Lett. CHPLBC 0009-2614 10.1016/S0009-2614(97)01391-2 283, 381 (1998).
5. S. Webster, D. A. Smith, D. N. Batchelder, and S. Karlin, Synth. Met. SYMEDZ 0379-6779 10.1016/S0379-6779(98)01103-5 102, 1425 (1999).
6. U. Durig, D. W. Pohl, and F. Rohner, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.336848 59, 3318 (1986).
7. G. A. Massey, J. A. Davis, S. M. Katnik, and E. Omon, Appl. Opt. APOPAI 0003-6935 24, 1498 (1985).
8. A. Piednoir and F. Creuzet, Micron MCONEN 0968-4328 10.1016/S0968- 4328(96)00026-1 27, 335 (1996).
9. M. K. Hong, A. G. Jeung, N. V. Dokholyan, T. I. Smith, H. A. Schwttman, P. Huie, and S. Erramilli, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 10.1016/S0168-583X(98)00311-5 144, 246 (1998).
10. C. A. Michaels, S. J. Stranick, L. J. Richter, and R. R. Cavanagh, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1309034 88, 4832 (2000).
11. D. Vobornik, G. Margaritondo, J. S. Sanghera, P. Thielen, I. D. Aggarwal, B. Ivanov, N. H. Tolk, V. Manni, S. Grimaldi, A. Lisi, S. Rieti, D. W. Piston, R. Generosi, M. Luce, P. Perfetti, and A. Cricenti, J. Alloys Compd. JALCEU 0925-8388 401, 80 (2005).
12. A. Cricenti, R. Generosi, M. Luce, P. Perfetti, G. Margaritondo, D. Talley, J. S. Sanghera, I. D. Aggarwal, N. H. Tolk, A. Congiu-Castellano, M. A. Rizzo, and D. W. Piston, Biophys. J. BIOJAU 0006-3495 85, 2705 (2003).
13. D. Vobornik, G. Margaritondo, J. S. Sanghera, P. Thielen, I. D. Aggarwal, B. Ivanov, J. K. Miller, R. Haglund, N. H. Tolk, A. Congiu-Castellano, M. A. Rizzo, D. W. Piston, F. Somma, G. Baldacchini, F. Bonfigli, T. Marolo, F. Flora, R. M. Montereali, A. Faenov, T. Pikuz, G. Longo, V. Mussi, R. Generosi, M. Luce, P. Perfetti, and A. Cricenti, Infrared Phys. Technol. IPTEEY 1350-4495 10.1016/j.infrared.2004.01.007 45, 409 (2004).
14. B. Knoll and F. Keilmann, Nature (London) NATUAS 0028-0836 10.1038/20154 399, 134 (1999).
15. A. Larhech, R. Bachelot, P. Gleyzes, and A. C. Boccara, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.119798 71, 575 (1998).
16. G. Martínez-Criado, A. Somogyi, A. Homs, R. Tucoulou, and J. Susini, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1989446 87, 061913 (2005).
17. G. Martínez -Criado, B. Alen, A. Homs, A. Somogyi, C. Miskys, J. Susini, R. Tucoulou, J. Pereira, and J. Martinez-Pastor, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2399363 89, 221913 (2006).
18. N. R. J. Poolton, B. Hamilton, and D. A. Evans, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/38/9/023 38, 1478 (2005).
19. N. R. J. Poolton, B. M. Towlson, B. Hamilton, and D. A. Evans, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 246, 445 (2006).
20. H. C. Kang, J. Maser, G. B. Stephenson, C. Liu, R. Conley, A. T. Macrander, and S. Vogt, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett. 96.127401 96, 127401 (2006).
21. G. G. Schroer, O. Kurapova, J. Patommel, P. Boye, J. Feldkamp, B. Lengeler, M. Burghammer, C. Riekel, L. Vincze, A. van der Hart, and M. Kuchler, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2053350 87, 124103 (2005).
22. D. H. Bilderback, S. A. Hoffman, and D. J. Thiel, Science SCIEAS 0036-8075 10.1126/science.8284671 263, 201 (1994).
23. A. Snigirev, A. Bjeoumikhov, A. Erko, I. Snigireva, M. Grigoriev, M. Erko, and S. Bjeoumikhova, J. Synchrotron Radiat. JSYRES 0909-0495 14, 227 (2007).
24. K. Karrai and R. Grober, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.113340 66, 1842 (1995).
25. E. Ziegler, S. de Panfilis, L. Peverini, P. van Vaerenbergh, and F. Rocca, AIP Conf. Proc. APCPCS 0094-243X 10.1063/1.2436314 879, 1349 (2007).
26. S. Larcheri, C. Armellini, F. Rocca, A. Kuzmin, R. Kalendarev, G. Dalba, R. Graziola, J. Purans, D. Pailharey, and F. Jandard, Superlattices Microstruct. SUMIEK 0749-6036 10.1016/j.spmi.2005.08.048 39, 267 (2006).
27. S. Larcheri, F. Rocca, D. Pailharey, F. Jandard, R. Graziola, A. Kuzmin, R. Kalendarev, and J. Purans, " A new tool for nanoscale X-ray absorption spectroscopy and element specific SNOM microscopy.," Micron MCONEN 0968-4328 (2008).
28. T. Oi, K. Takagi, and T. Fukazawa, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.91452 36, 278 (1980).
29. S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Prog. Mater. Sci. PRMSAQ 0079-6425 10.1016/j.pmatsci.2004.04.001 50, 293 (2005).
30. S. Larcheri, F. Rocca, D. Pailharey, F. Jandard, R. Graziola, G. Dalba, A. Kuzmin, R. Kalendarev, and J. Purans, " Nanostructure of mixed ZnWO4 thin film probed by combined XAS-SNOM technique.," (to be publish).
31. Z. L. Wang, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/16/25/R01 16, R829 (2004).
32. G. Dalba, N. Daldosso, P. Fornasini, M. Grimaldi, R. Grisenti, and F. Rocca, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.9911 62, 9911 (2000).
33. G. Dalba, N. Daldosso, P. Fornasini, R. Grisenti, L. Pavesi, F. Rocca, G. Franzó, F. Priolo, and F. Iacona, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1543641 82, 889 (2003).
34. T. K. Sham, S. J. Naftel, P.-S. G. Kim, R. Sammynaiken, Y. H. Tang, I. Coulthard, A. Moewes, J. W. Freeland, Y.-F. Hu, and S. T. Lee, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.045313 70, 045313 (2004).
35. Y. L. Soo, S. W. Huang, Y. H. Kao, V. Chhabra, B. Kulkarni, J. V. D. Veliadis, and R. N. Bhargava, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.125049 75, 2464 (1999).
36. K. Tsuji, K. Wagatsuma, K. Sugiyama, K. Hiraga, and Y. Waseda, Surf. Interface Anal. SIANDQ 0142-2421 10.1002/(SICI)1096-9918(199903)27:3<132:: AID-SIA491>3.0.CO;2-D 27, 132 (1999).
37. A. Saito, J. Maruyama, K. Manabe, K. Kitamoto, K. Takahashi, K. Takami, M. Yabashi, Y. Tanaka, D. Miwa, M. Ishii, Y. Takagi, M. Akai-Kasaya, S. Shin, T. Ishikawa, Y. Kuwahara, and M. Aono, J. Synchrotron Radiat. JSYRES 0909-0495 10.1107/S0909049506001622 13, 216 (2006).
38. S. M. Gray, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 10.1016/S0368-2048(00)00116-X 109, 183 (2000).
39. M. Ishii, B. Hamilton, N. R. J. Poolton, N. Rigopoulos, S. De Gendt, and K. Sakurai, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2437073 90, 063101 (2007).