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APL Materials

Volumn 3, Issue 8, 2015, Pages

Characterizing the structure of topological insulator thin films

(4) Richardella, Anthony a Kandala, Abhinav a Lee, Joon Sue a Samarth, Nitin a

a PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84936971234 PISSN: None EISSN: 2166532X Source Type: Journal
DOI: 10.1063/1.4926455 Document Type: Article

Times cited : (56)

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