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Volumn 109, Issue 6, 2012, Pages

Manifestation of topological protection in transport properties of epitaxial Bi 2Se 3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

BERRY PHASE; CRITICAL THICKNESS; DIRAC FERMIONS; HIGH QUALITY; METALLIC SURFACE; SHUBNIKOV-DE HAAS OSCILLATIONS; SURFACE CONDUCTANCE; TOPOLOGICAL INSULATORS; WEAK ANTILOCALIZATION;

EID: 84864879247     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.066803     Document Type: Article
Times cited : (375)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.