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Applied Physics Letters

Volumn 95, Issue 5, 2009, Pages

Quintuple-layer epitaxy of thin films of topological insulator Bi 2 Se3

(8) Zhang, Guanhua a Qin, Huajun a Teng, Jing a Guo, Jiandong a Guo, Qinlin a Dai, Xi a Fang, Zhong a Wu, Kehui a

a INSTITUTE OF PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITIES; EPITAXY OF THIN FILMS; LAYER MODE; LOW-ENERGY ELECTRON DIFFRACTION; SELF-ORGANIZED; SI (1 1 1); SINGLE-CRYSTALLINE; X-RAY PHOTOELECTRONS;

CRYSTAL GROWTH; ELECTRON DIFFRACTION; EMISSION SPECTROSCOPY; MOLECULAR BEAMS; MOLECULAR DYNAMICS; PHOTOELECTRON SPECTROSCOPY; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; STOICHIOMETRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 68349131519 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3200237 Document Type: Article

Times cited : (354)

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