Restoring pristine Bi2Se3 surfaces with an effective Se decapping process

Nano Research

Volumn 8, Issue 4, 2015, Pages 1222-1228

  Dai, Jixia ^a   Wang, Wenbo ^a   Brahlek, Matthew ^a   Koirala, Nikesh ^a   Salehi, Maryam ^a   Oh, Seongshik ^a   Wu, Weida ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

molecular beam epitaxy; scanning tunneling microscopy; topological insulator

Indexed keywords

EID: 84936977577     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-014-0607-8     Document Type: Article

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