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Volumn 105, Issue 24, 2014, Pages

Controlled removal of amorphous Se capping layer from a topological insulator

(11) Virwani, Kumar a Harrison, Sara E b,c Pushp, Aakash a Topuria, Teya a Delenia, Eugene a Rice, Philip a Kellock, Andrew a Collins McIntyre, Liam c Harris, James b Hesjedal, Thorsten c Parkin, Stuart a

a IBM ALMADEN RESEARCH CENTER (United States)

b Stanford University (United States)

c UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CAPPING LAYER; RUTHERFORD BACK-SCATTERING SPECTROMETRY; TOP SURFACE; TOPOLOGICAL INSULATORS;

AUGER ELECTRON SPECTROSCOPY;

EID: 84919341378 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4904803 Document Type: Article

Times cited : (25)

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