SRAM ser in 90, 130 and 180 nm bulk and SOI technologies

IEEE International Reliability Physics Symposium Proceedings

Volumn 2004-January, Issue January, 2004, Pages 300-304

  Cannon, Ethan H ^a   Reinhardt, Daniel D ^a   Gordon, Michael S ^b   Makowenskyj, Paul S ^a  

^a IBM MICROELECTRONICS   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Alpha particles; Cosmic rays; Neutrons; Single event effects (SEE); Single event upset (SEU); Soft error rate (SER); Soft errors; SOI; System soft error rate (SSER); Technology scaling

Indexed keywords

ALPHA PARTICLES; COSMIC RAYS; DIGITAL STORAGE; ERROR CORRECTION; ERRORS; MICROPROCESSOR CHIPS; NEUTRONS; SEA LEVEL;

SINGLE EVENT EFFECTS; SINGLE EVENT UPSETS; SOFT ERROR; SOFT ERROR RATE; SOI; TECHNOLOGY SCALING;

RADIATION HARDENING;

EID: 84932102670     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2004.1315341     Document Type: Conference Paper

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