Single-event upsets in microelectronics: Fundamental physics and issues

MRS Bulletin

Volumn 28, Issue 2, 2003, Pages 111-116

  Tang, Henry H K ^a   Rodbell, Kenneth P ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Microelectronics; Radiation effects; Semiconductors; Single event upsets (SEUs); Soft error rates

Indexed keywords

ALPHA PARTICLES; CHARGED PARTICLES; COSMIC RAYS; IONIZING RADIATION; NEUTRONS; RADIATION EFFECTS; RELIABILITY;

FIELD FUNNELING; SINGLE EVENT UPSETS; THERMAL NEUTRONS;

MICROELECTRONIC PROCESSING;

EID: 0037292220     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2003.37     Document Type: Article

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