Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: Scaling effects on SEU and MBU cross sections

IEEE Transactions on Nuclear Science

Volumn 48, Issue 6 I, 2001, Pages 1946-1952

  Wrobel, F ^a,b   Palau, J M ^a,b   Calvet, M C ^a,c   Bersillon, O ^d   Duarte, H ^d  

^a IEEE   (France)

^b UNIV MONTPELLIER   (France)

^c AIRBUS GROUP INNOVATIONS   (Germany)

^d CEA DIF   (France)

Author keywords

Critical energy; Downscaling; HETC; Monte Carlo; Multiple bits upset; Nucleon; Sensitive volume; Single event upset (SEU); SRAM

Indexed keywords

SINGLE EVENT UPSETS (SEU);

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; HIGH ENERGY PHYSICS; MONTE CARLO METHODS; NEUTRONS; STATIC RANDOM ACCESS STORAGE;

NUCLEAR PHYSICS;

EID: 0035722922     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983155     Document Type: Conference Paper

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