Single-Event Upset in Evolving Commercial Silicon-on-Insulator Microprocessor Technologies

IEEE Transactions on Nuclear Science

Volumn 50, Issue 6 I, 2003, Pages 2107-2112

  Irom, F ^a   Farmanesh, F H ^a   Swift, G M ^a   Johnston, A H ^a   Yoder, G L ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

Author keywords

Alpha particles; Beams; Cosmic rays; Cyclotron; Heavy ion beams; Heavy ions; Microprocessors; Neutrons; Radiation effect; Registers; Silicon; Silicon on insulator; Transistors

Indexed keywords

ALPHA PARTICLES; AMPLIFICATION; BIPOLAR TRANSISTORS; CAPACITANCE; COSMIC RAYS; CYCLOTRONS; HEAVY IONS; MICROPROCESSOR CHIPS; NEUTRON BEAMS; RADIATION EFFECTS; RADIATION HARDENING; SHIFT REGISTERS; SILICON;

HEAVY ION BEAMS; REGISTERS; SILICON ON INSULATOR (SOI) MICROPROCESSORS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 1242265234     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.821820     Document Type: Conference Paper

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