Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects

Ultramicroscopy

Volumn 151, Issue , 2015, Pages 130-135

  Lehtinen, Ossi ^a   Geiger, Dorin ^a   Lee, Zhongbo ^a   Whitwick, Michael Brian ^b   Chen, Ming Wei ^b   Kis, Andras ^b   Kaiser, Ute ^a  

^a UNIVERSITY OF ULM   (Germany)

^b EPFL   (Switzerland)

Author keywords

Correction; HRTEM; Numerical image processing; Residual aberrations

Indexed keywords

ELECTRIC POWER FACTOR CORRECTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE PROCESSING; PROCESSING;

ABERRATION-CORRECTED; HRTEM; IMAGE INTENSITIES; INTERPRETABILITY; NUMERICAL IMAGES; POSTPROCESSING METHODS; RESIDUAL ABERRATION; SCATTERING OBJECTS;

NUMERICAL METHODS;

GRAPHENE;

ANALYTIC METHOD; ANALYTICAL PARAMETERS; ANTI SYMMETRIC ABERRATION; ARTICLE; CONCEPTUAL FRAMEWORK; FOURIER TRANSFORMATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; MATHEMATICAL COMPUTING; RADIATION SCATTERING; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84925515411     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.09.010     Document Type: Article

References (37)

1. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., Urban K. A spherical-aberration-corrected 200kV transmission electron microscope. Ultramicroscopy 1998, 75:53-60.
2. Scherzer O. Über einige Fehler von Elektronenlinsen. Z. Phys. 1936, 101:593-603.
3. Uhlemann S., Haider M. Residual wave aberrations in the first spherical aberration corrected transmission electron microscope. Ultramicroscopy 1998, 72:109-119.
4. Meyer J.C., Kisielowski C., Erni R., Rossell M.D., Crommie M.F., Zettl A. Direct imaging of lattice atoms and topological defects in graphene membranes. Nano Lett. 2008, 8:3582-3586.
5. Krivanek O.L., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature 2010, 464:571-574.
6. Gabor D. A new microscopic principle. Nature 1948, 161:777-778.
7. Lichte H. Electron holography approaching atomic resolution. Ultramicroscopy 1986, 20:293-304.
8. Geiger D., Lichte H., Linck M., Lehmann M. Electron holography with a Cs-corrected transmission electron microscope. Microsc. Microanal. 2008, 14:68-81.
9. Linck M. Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM. Ultramicroscopy 2013, 124:77-87.
10. Saxton W. What is the focus variation method? Is it new? Is it direct?. Ultramicroscopy 1994, 55:171-181.
11. Op de Beeck M., Van Dyck D., Coene W. Wave function reconstruction in HRTEM. the parabola method. Ultramicroscopy 1996, 64:167-183.
12. Kirkland A., Saxton W., Chau K.-L., Tsuno K., Kawasaki M. Super-resolution by aperture synthesis. tilt series reconstruction in CTEM. Ultramicroscopy 1995, 57:355-374.
13. Coene W., Thust A., Op de Beeck M., Van Dyck D. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 1996, 64:109-135.
14. Kirkland A., Saxton W., Chand G. Multiple beam tilt microscopy for super resolved imaging. J. Electron Microsc. 1997, 46:11-22.
15. Krivanek O., Stadelmann P. Effect of three-fold astigmatism on high resolution electron micrographs. Ultramicroscopy 1995, 60:103-113.
16. Meyer J.C., Kurasch S., Park H.J., Skákalová V., Künzel D., Groß A., Chuvilin A., Algara-Siller G., Roth S., Iwasaki T., Starke U., Smet J.H., Kaiser U. Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy. Nat. Mater. 2011, 10:209-215.
17. Biskupek J., Hartel P., Haider M., Kaiser U. Effects of residual aberrations explored on single-walled carbon nanotubes. Ultramicroscopy 2012, 116:1-7.
18. Barthel J., Thust A. On the optical stability of high-resolution transmission electron microscopes. Ultramicroscopy 2013, 134:6-17.
19. Thust A., Overwijk M., Coene W., Lentzen M. Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 1996, 64:249-264.
20. Saxton W. Accurate atom positions from focal and tilted beam series of high resolution electron micrographs. Scanning Microsc. 1988, 2:213-224.
21. Lee Z., Meyer J., Rose H., Kaiser U. Optimum HRTEM image contrast at 20kV and 80kV-exemplified by graphene. Ultramicroscopy 2012, 112:39-46.
22. Buseck P., Cowley J., Eyring L. High-Resolution Transmission Electron Microscopy and Associated Techniques 1989, Oxford University Press, Oxford, United Kingdom.
23. Ishizuka K. Phase retrieval from image intensities. why does exit wave restoration using IWFR work so well?. Microscopy 2013, 62:S109-S118.
24. J. Barthel, Ultra-Precise Measurement of optical aberrations for sub-Ångström transmission electron microscopy (Ph.D. thesis), Rheinisch-Westfälische Technische Hochschule Aachen, 2007.
25. Meyer R., Kirkland A., Saxton W. A new method for the determination of the wave aberration function for high resolution TEM. 1. measurement of the symmetric aberrations. Ultramicroscopy 2002, 92:89-109.
26. Meyer R., Kirkland A., Saxton W. A new method for the determination of the wave aberration function for high-resolution TEM. 2. measurement of the antisymmetric aberrations. Ultramicroscopy 2004, 99:115-123.
27. Stenkamp D. Detection and quantitative assessment of image aberrations from single HRTEM lattice images. J. Microsc. 1998, 190:194-203.
28. Algara-Siller G., Lehtinen O., Turchanin A., Kaiser U. Dry-cleaning of graphene. Appl. Phys. Lett. 2014, 104:153115.
29. O. Lehtinen, N. Vats, G. Algara-Siller, P. Knyrim, U. Kaiser, Implantation and Atomic Scale Investigation of Self-interstitials in Graphene, 2014. http://arxiv:1407.3071.
30. O. Lehtinen, H.-P. Komsa, M.B. Whitwick, M.-W. Chen, A. Pulkin, O. Yazyev, A. Kis, A.V. Krasheninnikov, U. Kaiser, Microstructure in Se-deficient 2D MoSe2, in preparation.
31. C. Koch, Determination of core structure periodicity and point defect density along dislocations (Ph.D. thesis), Arizona State University, 2002.
32. Lehtinen O., Tsai I.-L., Jalil R., Nair R.R., Keinonen J., Kaiser U., Grigorieva I.V. Non-invasive transmission electron microscopy of vacancy defects in graphene produced by ion irradiation. Nanoscale 2014, 6:6569-6576.
33. Grantab R., Shenoy V.B., Ruoff R.S. Anomalous strength characteristics of tilt grain boundaries in graphene. Science 2010, 330:946-948.
34. Yazyev O.V., Louie S.G. Topological defects in graphene. dislocations and grain boundaries. Phys. Rev. B 2010, 81:195420.
35. Huang P.Y., Ruiz-Vargas C.S., van der Zande A.M., Whitney W.S., Levendorf M.P., Kevek J.W., Garg S., Alden J.S., Hustedt C.J., Zhu Y., Park J., McEuen P.L., Muller D.A. Grains and grain boundaries in single-layer graphene atomic patchwork quilts. Nature 2011, 469:389-392.
36. Kurasch S., Kotakoski J., Lehtinen O., Skákalová V., Smet J., Krill C.E., Krasheninnikov A.V., Kaiser U. Atom-by-atom observation of grain boundary migration in graphene. Nano Lett. 2012, 12:3168-3173.
37. Banhart F., Kotakoski J., Krasheninnikov A.V. Structural defects in graphene. ACS Nano 2010, 5:26-41.