Optical and surface probe investigation of secondary phases in Cu2ZnSnS4 films grown by electrochemical deposition

Solar Energy Materials and Solar Cells

Volumn 139, Issue , 2015, Pages 10-18

  Kim, Gee Yeong ^a   Jo, William ^a   Lee, Kee Doo ^b   Choi, Hee Su ^b   Kim, Jin Young ^b   Shin, Hae Young ^a   Nguyen, Trang Thi Thu ^a   Yoon, Seokhyun ^a   Joo, Beom Soo ^c   Gu, Minseon ^c   Han, Moonsup ^c  

^a Ewha Womans University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

^c University of Seoul   (South Korea)

Author keywords

Cu2ZnSnS4; Electrochemical deposition; Kelvin probe force microscopy; Raman scattering spectroscopy; Secondary phases; Work function

Indexed keywords

DEPOSITION; ELECTRODEPOSITION; NANOTECHNOLOGY; PROBES; RAMAN SCATTERING; REDUCTION; WORK FUNCTION; ZINC SULFIDE;

ABSORPTION LAYER; ELECTROCHEMICAL DEPOSITION; KELVIN PROBE FORCE MICROSCOPY; MICRO RAMAN SCATTERING SPECTROSCOPY; PHASE UNIFORMITY; RAMAN SCATTERING SPECTROSCOPY; SECONDARY PHASIS; SURFACE CHARACTERISTICS;

COPPER;

EID: 84925411110     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2015.03.003     Document Type: Article

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