An investigation of band profile around the grain boundary of Cu(InGa)Se2 solar cell material by scanning probe microscopy

Progress in Photovoltaics: Research and Applications

Volumn 21, Issue 4, 2013, Pages 595-599

  Takihara, Masaki ^a   Minemoto, Takashi ^b   Wakisaka, Youichi ^b   Takahashi, Takuji ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

band profile; CIGS; grain boundary; scanning probes; solar cell

Indexed keywords

BAND PROFILE; CIGS; CONDUCTION BAND EDGE; KELVIN PROBE FORCE MICROSCOPY; PHOTOGENERATED ELECTRONS; SCANNING PROBES; SCANNING TUNNELING SPECTROSCOPY; SOLAR CELL MATERIALS;

GRAIN BOUNDARIES; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SOLAR CELLS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84878167313     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1235     Document Type: Article

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